نوع مقاله : مقاله پژوهشی
نویسنده
دانشگاه صنعتی امیر کبیر، دکتری مخابرات
چکیده
کلیدواژهها
عنوان مقاله [English]
نویسنده [English]
This paper develops a permittivity measurement method using a multilayer microstrip structure. It provides modeling and analysis of the proposed structure. The employed method introduces new blocks in the multilayer microstrip model, which can cause more accurate characterization results. These blocks are for modeling the effect of different layers of the transmission line including the material under test and the other layers. Here, a multilayer planar measurement kit is provided for extracting the dielectric parameters of different materials. This measurement kit can measure relative permittivity as well as loss tangent for dielectrics. In addition, this kit can be used for characterization of solid and liquid dielectrics. The measurement setup is typically designed and fabricated for 2 GHz frequency, although it can cover higher frequencies e.g. X bands. The dominant mode and the higher order modes of the resonator can be used for measuring material parameters, in a wide range of frequency. The analytic, simulation and measurement results illustrate good agreement with each other, which confirms the accuracy of the proposed routine.
کلیدواژهها [English]
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